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Paris Electrical and Electronic Engineering Laboratory (GeePs) - UMR 8507

The Paris Electrical and Electronic Engineering Laboratory (laboratoire Génie électrique et électronique de Paris – GeePs) was created in 1968. Originally a research unit associated to the CNRS (URA 127), in 1998 it became a mixed CNRS-Supélec research unit (UMR 8507) run by Sorbonne Université and Paris Sud 11. A part of the Science and Technology of Information and Engineering department of the CNRS, it is attached to section 8 of the Comité National d’Evaluation (National Evaluation Committee).


The research themes of the LGEP, which covers the Electrical Engineering spectrum in its broadest sense, are organized into three main divisions:


- Electromagnetic systems (their modeling and control);

- Contactors (for electrical engineering, electronics and optronics);

- New materials and components for these disciplines.


The GeePs is a part of the SPEE Labs groups, and is affiliated to two réseaux thématiques de recherche avancée -  RTRA (thematic networks for advanced research)  of the southern Paris region: "Triangle de la Physique " et "Digiteo".

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The laboratory includes 5 research teams, divided into 2 departments:


The MADELEC department run by Sophie Noel: “Materials and devices for electronics (Matériaux et dispositifs pour l’électronique)”.

  • Contactors (Contacts électriques - CE),
  • Material and devices, from microwaves to infrared (Matériaux et dispositifs des microondes à l’infrarouge - MDMI),
  • Semiconductors in Thin Films (Semiconducteurs en couches minces - SCM).

The MOCOSEM department run by Adel Razek: “Modeling and control of electromagnetic systems (Modélisation et contrôle de systèmes électromagnétiques)”.

  • Design control and diagnostics (Conception commande et diagnostic - COCODI),
  • Interaction Fields materials structures (Interaction champs matériaux structures - ICHAM).

The MADELEC department comprises the three laboratory teams working in the field of materials applied to different types of electronic device (photovoltaics, sensors, detectors and connection and switch devices). The material studied ranges from semiconductors and semi insulators to superconductors and composite materials for the SCM and MDMI teams, while the CE team concentrates on metallic materials and metallic surfaces modified with thin  organic films, used for low-level and powerful electrical contacts. The department also includes a transverse research theme on “Near Field Microscopy”.


The MOCOSEM department concentrates on developing methods best suited to the determination of electromagnetic fields in materials and structures, to the design, control and diagnostic of systems and to the modeling of phenomena governed by systems of coupled equations. This research allows a number of practical problems to be addressed, related to magnetostatics, electrostatics, magnetodynamics and the propagation of electromagnetic waves (EMF, CND, CAD, optimization, diagnosis, control ...). The department is structured by a research theme common to both its teams: “Modeling of Multiphysic Phenomena” (MUPHY).


Electronic and optoelectronic components, electromagnetism, electronical engineering, nanostructured materials, materials for energy, micro-nano technology, optoelectronics, optical systems, photonics.

Teams and research themes

Semiconductors in Thin Films (Semiconducteurs en couches minces - SCM): The SCM team develops characterization techniques, theoretical analyses and modeling for the study of materials and devices in the fields of photovoltaics and wide band gap semiconductors.


Material and devices, from microwaves to infrared (Matériaux et dispositifs, des microondes à l’infrarouge - MDMI): the study of the interaction of microwaves with matter in complex environments. The study of oxide thin films: realization of microwave  passive devices and imagers in the terahertz field.


Electrical Contacts (Contacts électriques - CE): developing various characterization tools for contact materials at the macro- and microscopic scales (low level: friction, vibration; powerful: arcing, Joule heating). Physical analysis of phenomena and modeling. Innovative coatings


Interaction Fields materials structures (Interaction champs matériaux structures - ICHAM): Modeling and characterization of active materials (piezoelectrical, magnetostrictive). Coupling between waves and complex structures.


Design control and diagnostics (Conception commande et diagnostic - COCODI):


Current Projects

Multiscale methods for modeling coupled phenomena. Antennas based on metamaterials.


HETSI project (Heterojunctions a-Si/c-Si) of the 7th Framework Programme for Research and Technological Development; IFCPAR project (Indo-French Centre

for the Promotion of Advanced Research); PICS project (CNRS International Projects for Scientific Cooperation) with Russia, Polonium Project, CNRS-NIMS Project (Japan), 7 ANR (National Research Agency - Agence national de la recherche) projects.


ANR "blanc" NANOCONNECT project (ultrathin organic coatings) ; PREDIT/ANR SEEDS project (failure diagnosis on automotive  cables) ; ANR PNano ALICANTE project (extremely low-level electrical measurements on AFM probe/surface  nanocontacts) ; PIDEA HYMSTAC European project (miniature multi-contact stacking connector).


NANOTIME European project: superconducting networks for passive imaging and semiconductors for active imaging.


Industrial projects: Microwave-biological media interaction. Analysis of saltwater + oil mixtures.  Improvement of tin coatings for low level contacts. MEMS switches.  Heat transfer in power connectors.  Multiscale models for magneto-mechanical coupled phenomena. Metamaterials for antennas.

Scientific advances, significant results

Homogenization of metamaterials. Modeling of coupled phenomena.

New fabrication technology for the development of diamond devices with outstanding ultra-violet detection performance.

Hot-electron nanobolometers for THz imaging. Microwave sensors for triphase fluids and related chemistry. Wear-resistant ultrathin organic films and conductors.

Power balance at arcing electrodes. Local electrical measurements by conducting probe AFM (wide-range at high scan rates).

Graduate Schools

ED 391 – Mechanics, Acoustics, Electronics, Paris (SMAE)

STITS (Science and Technology of Information, Telecommunications and Systems) Paris Sud 1

Scientific partnerships

SATIE, L2S, LPICM (École Polytechnique), IRDEP, CEA/Saclay, LCMTR (Thiais), GEMaC (Meudon), Observatoire de Paris, LISIF Sorbonne Université, DRE Supélec, Chimie Paris Sud 11, ENS-Paris, Pitié-Salpétrière, ITODYS-Paris7, LCMCP-ENSCP, LCSI (CEA/Saclay), Département Energie de Supélec (Supelac Energy Department), LPS et ICMMO (Paris-Sud), UMR CNRS/Thales.


LGEF, IRSEEM, CEA/Grenoble, INES (Chambéry), INSA-Lyon, Triangle de la Physique, CEA-Grenoble, Université Rennes 1, CIMMA (Angers), Institut Carnot de Bourgogne.


University of Santa Catarina (Brazil), University of Singapore, Ioffe Institute and the Saint-Petersburg Physics and Technology Centre for Research and Education of the Russian Academy of Sciences, Universities of Oldenburg and Hagen, Energy Research Unit (Calcutta, India), NIMS (Tsukuba, Japan), ITME (Warsaw, Poland), EPFL (Ch), NPL (UK), Karlsruhe (Germany).

Industrial partnerships

EADS/ASTRIUM - Framatome Connectors International - PSA - Renault - Renault Trucks - Delphi - Volvo - Schneider Electric - PEM (Protection Electrolytique des Métaux or Electrolytic Protection of Metals) - Valeo - CEA-LIST - CNES, Alcatel-Thales III-V Lab, SATIMO, SAFT, GEOSERVICES, SNECMA, CEA-DAM.


SME: Accuwatt, Concept Scientifique Instruments.

Main equipment
  • Platform for the characterization of active materials
  • UV/VIS/Near IR Spectrometer
  • Fourier transform infrared spectrometer
  • Solar simulator
  • Several MPC (Modulated Photocurrent) and TOF (Time-Of-Flight) measurement systems.
  • SSPG (Steady-State Photocarrier Grating) measurement system
  • Spectral Photoresponse system.
  • Admittance spectroscopy systems
  • Surface analysis (XPS, AES, RGA)
  • Atomic force microscopy (AFM, LFM): 3 systems (including 1 controlled environment) + local electrical measurement modules.
  • 3D optical profiler
  • Contact angle measuring device
  • 4 point surface resistivity measurements
  • Several electrical and mechanical benches for low level electrical contacts testing (static contact resistance, friction coefficient, vibrating)  
  • Several electrical, mechanical and thermal benches for power contacts testing (arcing, circuit opening, Joule heating).   IR thermal camera
  • High speed camera
  • Glow-arc transition studying device  
  • Sputtering and electron beam evaporation deposition units / Ion beam milling technique
  • Electrical and optical cryogenics benches
  • Network analyzers and impedance meters
Contact Informations
Contact Informations
01 69 85 16 31
Physical address
Laboratoire Génie électrique et élictronic de Paris
11 rue Joliot-Curie
Plateau de Moulon
91192 Gif-sur-Yvette cedex.

Laboratory's mail

Mailing address
11 rue Joliot-Curie,
Plateau de Moulon,
91192 Gif-sur-Yvette cedex.

Communications Contact
HOUZÉ Frédéric
01 69 85 16 43
Administrative Contact
RICHARD Françoise
01 69 85 16 32


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